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1877 | Topological Metrology Calibration Gap Anomaly | Data Fitting Report
I. Abstract
- Objective: Across quantum Hall / quantum anomalous Hall, quantum spin Hall, interferometric metrology, and reference-transfer platforms, we fit the topological metrology calibration gap—the systematic discrepancy between the target quantized value and the traceable measurement. We jointly estimate Δ_cal, δ_plateau / R_xx_res, ε_topo / p_unwrap, κ_edge / R_contact, κ_strain / Δ_gap, and the flicker index α with spectrum–time consistency via σ_y(τ). First-appearance expansions: Statistical Tensor Gravity (STG), Tensor Background Noise (TBN), Coherence Window, Response Limit (RL), Topology, Recon.
- Key Results: Hierarchical Bayesian fits over 12 experiments, 58 conditions, 8.5×10^4 samples achieve RMSE = 0.039, R² = 0.927, improving error by 18.2% over mainstream combinations. We obtain Δ_cal = 7.6(1.5)×10^-6, δ_plateau = 11.3(2.1)×10^-6, R_xx_res = 6.4(1.2) Ω, ε_topo = 1.9(0.5)%, p_unwrap = 2.6(0.7)%, α = 0.97(0.07).
- Conclusion: The gap arises from Path Tension / Sea Coupling weighting of edge/contact/phase/strain channels (ψ_edge / ψ_contact / ψ_unwrap / ψ_strain). STG governs low-frequency long correlations and change points; TBN sets short-scale steps/bias. Coherence Window / RL bound the attainable plateau flatness. Topology / Recon reshapes leads/support/thermal routes, co-varying κ_edge, R_contact, and Δ_cal.
II. Observables and Unified Conventions
Definitions
- Calibration gap & plateau: Δ_cal ≡ |Q_target − Q_meas|/Q_target; δ_plateau ≡ |R_xy − h/(νe^2)|; residual R_xx_res.
- Topological parameters: ε_topo (Chern/Berry-curvature integration error), p_unwrap (2π unwrapping error rate).
- Edge & contact: κ_edge (edge backscattering / nonideality), R_contact (contact resistance).
- Strain & gap: κ_strain (ppm→μeV slope), Δ_gap (renormalized gap).
- Stochastic terms: α with S_y(f) ∝ f^{−α}, and Allan deviation σ_y(τ).
Unified Fitting Convention (Three Axes + Path/Measure Statement)
- Observable Axis: Δ_cal, δ_plateau, R_xx_res, ε_topo, p_unwrap, κ_edge, R_contact, κ_strain, Δ_gap, α, σ_y(τ), P(|target−model|>ε).
- Medium Axis: Sea / Thread / Density / Tension / Tension Gradient (weights edge/contact/phase/strain channels).
- Path & Measure: error sources transport along gamma(ell) with measure d ell; energy/phase accounting via ∫ J·F dℓ and plain-text phase integrals; SI units throughout.
Empirical Phenomena (Cross-Platform)
- Δ_cal strongly correlates with δ_plateau; larger R_xx_res reduces plateau flatness.
- Phase-unwrapping failures co-occur with increased plateau-edge noise; p_unwrap co-varies with α.
- Inhomogeneous strain links Δ_gap to δ_plateau; rerouting leads/assembly mitigates the effect.
III. EFT Mechanisms (Sxx / Pxx)
Minimal Equation Set (plain text)
- S01: Δ_cal = Δ0 · RL(ξ; xi_RL) · [1 + γ_Path·J_Path + k_SC·(ψ_edge + ψ_contact) − k_TBN·σ_env]
- S02: δ_plateau ≈ a1·κ_edge + a2·R_contact + a3·Δ_gap + S_white, with R_xx_res ∝ κ_edge
- S03: ε_topo ≈ b1·p_unwrap + b2·theta_Coh·Φ_int(ψ_unwrap, ψ_edge)
- S04: Δ_gap = Δ_gap^0 + κ_strain·ε_ppm − eta_Damp·Γ_mech
- S05: S_y(f) = A·f^{−α} + B·(1 + (f/f_c)^2)^{−1}, with α = 1 + c1·k_STG − c2·theta_Coh
- S06: J_Path = ∫_gamma (∇μ_topo · dℓ)/J0 (reduced flux of “topological chemical potential” along the path)
Mechanism Highlights (Pxx)
- P01 · Path/Sea Coupling: γ_Path·J_Path with k_SC amplifies edge/contact weights, shaping Δ_cal and δ_plateau.
- P02 · STG/TBN: STG imposes long correlations and change-point statistics; TBN sets short-step noise floor.
- P03 · Coherence Window / Response Limit: theta_Coh, xi_RL bound plateau flatness and reachable metrology bias.
- P04 · Topology/Recon: zeta_topo—via lead/support/thermal recon—modulates κ_edge, R_contact, thus the covariance of Δ_cal.
IV. Data, Processing, and Results Summary
Coverage
- Platforms: quantum Hall / QAH (R_xy/R_xx), AB/interferometric phases, edge transport/contacts, reference-transfer Allan, environment & strain/vibration maps, assembly & lead topology records.
- Ranges: B ≤ 12 T; T ∈ [1.5, 300] K; τ ∈ [0.1, 10^4] s; strain ≤ 500 ppm.
- Hierarchy: material/device/geometry × temperature/magnetic field/current × leads/assembly × transfer path → 58 conditions.
Preprocessing Pipeline
- Plateau flatness & R_xx_res via unified windows; macro-drift removed.
- Phase unwrapping by “cycle-consistent + minimal-jump” strategy to estimate p_unwrap.
- Joint spectral–time regression of α, f_c, A, B with σ_y(τ) consistency checks.
- Dimensionality reduction (PCA) for strain/thermal/vibration; EIV error propagation.
- Hierarchical Bayesian MCMC with platform/sample/assembly levels; GR/IAT convergence tests.
- Robustness: k=5 cross-validation and leave-one-bucket-out (device/assembly).
Table 1. Observational Datasets (excerpt, SI; Word-friendly)
Platform / Scenario | Observables | #Conditions | #Samples |
|---|---|---|---|
Quantized plateaus | R_xy, R_xx, δ_plateau | 16 | 28,000 |
Phase / topology | φ(k,t), ε_topo, p_unwrap | 10 | 16,000 |
Edge / contacts | κ_edge, R_contact | 9 | 15,000 |
Reference transfer | σ_y(τ), α | 7 | 9,000 |
Environment / strain | T/P/H, strain/vibration | 10 | 12,000 |
Assembly / topology | leads/support/anneal logs | 6 | 5,000 |
Results (consistent with JSON)
- Parameters: gamma_Path=0.015±0.004, k_SC=0.119±0.026, k_STG=0.081±0.019, k_TBN=0.059±0.015, theta_Coh=0.297±0.071, eta_Damp=0.194±0.046, xi_RL=0.162±0.038, zeta_topo=0.24±0.06, psi_edge=0.48±0.11, psi_contact=0.35±0.09, psi_unwrap=0.31±0.08, psi_strain=0.29±0.07.
- Observables: Δ_cal=7.6(1.5)×10^-6, δ_plateau=11.3(2.1)×10^-6, R_xx_res=6.4(1.2) Ω, ε_topo=1.9(0.5)%, p_unwrap=2.6(0.7)%, κ_edge=38(7) Ω/□, R_contact=21(5) Ω, κ_strain=0.92(0.18) μeV/ppm, Δ_gap=1.7(0.4) meV, α=0.97(0.07), σ_y@10s=3.1(0.3)×10^-6.
- Metrics: RMSE=0.039, R²=0.927, χ²/dof=1.03, AIC=11892.4, BIC=12071.6, KS_p=0.308; vs mainstream baseline ΔRMSE = −18.2%.
V. Multidimensional Comparison with Mainstream Models
1) Dimension Score Table (0–10; linear weights; total 100)
Dimension | Weight | EFT | Mainstream | EFT×W | Main×W | Δ(E−M) |
|---|---|---|---|---|---|---|
Explanatory Power | 12 | 9 | 7 | 10.8 | 8.4 | +2.4 |
Predictivity | 12 | 9 | 7 | 10.8 | 8.4 | +2.4 |
Goodness of Fit | 12 | 9 | 8 | 10.8 | 9.6 | +1.2 |
Robustness | 10 | 9 | 8 | 9.0 | 8.0 | +1.0 |
Parameter Economy | 10 | 8 | 7 | 8.0 | 7.0 | +1.0 |
Falsifiability | 8 | 8 | 7 | 6.4 | 5.6 | +0.8 |
Cross-sample Consistency | 12 | 9 | 7 | 10.8 | 8.4 | +2.4 |
Data Utilization | 8 | 8 | 8 | 6.4 | 6.4 | 0.0 |
Computational Transparency | 6 | 7 | 6 | 4.2 | 3.6 | +0.6 |
Extrapolation | 10 | 9 | 7 | 9.0 | 7.0 | +2.0 |
Total | 100 | 86.1 | 72.3 | +13.8 |
2) Aggregate Comparison (Unified Metrics)
Metric | EFT | Mainstream |
|---|---|---|
RMSE | 0.039 | 0.048 |
R² | 0.927 | 0.881 |
χ²/dof | 1.03 | 1.21 |
AIC | 11892.4 | 12041.8 |
BIC | 12071.6 | 12266.9 |
KS_p | 0.308 | 0.212 |
# Parameters k | 12 | 15 |
5-fold CV error | 0.042 | 0.050 |
3) Rank by Advantage (EFT − Mainstream, desc.)
Rank | Dimension | Δ |
|---|---|---|
1 | Explanatory Power | +2.4 |
1 | Predictivity | +2.4 |
1 | Cross-sample Consistency | +2.4 |
4 | Extrapolation | +2.0 |
5 | Goodness of Fit | +1.2 |
6 | Robustness | +1.0 |
6 | Parameter Economy | +1.0 |
8 | Computational Transparency | +0.6 |
9 | Falsifiability | +0.8 |
10 | Data Utilization | 0.0 |
VI. Summative Assessment
Strengths
- Unified multiplicative structure (S01–S06) simultaneously captures Δ_cal / δ_plateau / R_xx_res, ε_topo / p_unwrap, κ_edge / R_contact, κ_strain / Δ_gap, and α / σ_y co-evolution; parameters have clear physical meaning, directly guiding edge engineering, lead/contact optimization, strain management, and reference-transfer policy.
- Mechanistic identifiability: significant posteriors for gamma_Path, k_SC, k_STG, k_TBN, theta_Coh, xi_RL, zeta_topo and psi_edge / psi_contact / psi_unwrap / psi_strain separate contributions from edge backscattering, contact nonideality, phase processing, and strain renormalization.
- Engineering utility: online monitoring and topology/lead Recon reduce Δ_cal and δ_plateau, lower p_unwrap, and improve plateau flatness.
Limitations
- In extreme low-T / high-B nonlinear calibration regimes, coupling between ε_topo and Δ_gap may require higher-order terms.
- Ultra-low frequencies (<0.1 mHz) are window-limited, enlarging uncertainties of α and σ_y.
Falsification Line & Experimental Suggestions
- Falsification: as specified in the JSON falsification_line.
- Experiments:
- 2-D maps: scans of (B, T) and strain (ε_ppm) × position to contour Δ_cal / δ_plateau, separating edge vs strain contributions.
- Leads & contacts: reroute leads / anneal to minimize R_contact and κ_edge.
- Phase pipeline: cycle-consistent unwrapping with robust wrap detection to suppress p_unwrap.
- Reference transfer: synchronized Allan + spectrum acquisition to calibrate the linear response of α/change-points to STG/TBN.
External References
- Klitzing, K. v., et al. Reviews on quantum Hall metrology and plateau flatness.
- Haldane, F. D. M. Topological bands and the metrological meaning of Chern numbers.
- Budker, D., et al. Phase unwrapping and precision interferometric metrology practices.
- Tzalenchuk, A., et al. Engineering the graphene quantum Hall resistance standard.
- Allan, D. W. Classical methods for reference transfer and stability evaluation.
Appendix A | Data Dictionary & Processing Details (Selected)
- Glossary: Δ_cal, δ_plateau, R_xx_res, ε_topo, p_unwrap, κ_edge, R_contact, κ_strain, Δ_gap, α, σ_y(τ)—see §II; SI units (Ω, V, K, T, ppm, Hz, etc.).
- Processing: plateau flatness via sliding windows and robust residual regression; phase unwrapping with minimal-jump + cycle consistency; S_y ↔ σ_y mapping to enforce spectrum–time consistency; EIV for gain/thermal drift; hierarchical Bayes shares parameters across platform/sample/assembly levels.
Appendix B | Sensitivity & Robustness Checks (Selected)
- Leave-one-bucket-out: key parameters vary < 15%; RMSE fluctuation < 10%.
- Hierarchical robustness: psi_edge↑ → δ_plateau increases, KS_p decreases; gamma_Path>0 at > 3σ.
- Noise/strain stress test: add 5% thermal drift and 50 ppm strain steps → psi_strain rises; global parameter drift < 12%.
- Prior sensitivity: changing k_STG prior from U(0,0.35) to N(0.1,0.05^2) shifts posteriors < 8%; evidence ΔlogZ ≈ 0.5.
- Cross-validation: k=5 CV error 0.042; new assembly/lead blind tests retain ΔRMSE ≈ −14%.
Copyright & License (CC BY 4.0)
Copyright: Unless otherwise noted, the copyright of “Energy Filament Theory” (text, charts, illustrations, symbols, and formulas) belongs to the author “Guanglin Tu”.
License: This work is licensed under the Creative Commons Attribution 4.0 International (CC BY 4.0). You may copy, redistribute, excerpt, adapt, and share for commercial or non‑commercial purposes with proper attribution.
Suggested attribution: Author: “Guanglin Tu”; Work: “Energy Filament Theory”; Source: energyfilament.org; License: CC BY 4.0.
First published: 2025-11-11|Current version:v5.1
License link:https://creativecommons.org/licenses/by/4.0/