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Chapter 12 — Error Budget & System Safeguards
I. One-Sentence Goal
Establish an end-to-end error model and protection framework for early objects from causation (seed/trigger) → growth (state) → radiation (L_nu/LC) → propagation (n_eff, segmentation, two forms) → observation (T_arr/Delta_T_arr/F_nu/LC). Provide both GUM and MC uncertainty propagation, two-form–specific errors, thin/thick switching tau_switch, interface energy closure and sidedness, differential out-of-band leakage, c_ref drift, coordinate/unit consistency, and auditable criteria for spectral and causation parameter ill-posedness and clamping/saturation—together with falsification lines.
II. Scope & Non-Goals
Covered: error stratification and sources; two-form GUM/MC propagation formulae; spectrum–arrival joint propagation; thin/thick consistency; safeguard checklist; energy closure and sidedness; differential OOB leakage; path discretization and quadrature error; c_ref calibration/drift; K-correction and luminosity distance; guardband and falsification; logging and interface anchors.
Not covered: re-derivation of Chs. 3–9; detailed instrument response; any propagation construct violating n_eff ≥ 1.
III. Minimal Terms & Symbols
- Observables: T_arr_obs(f, gamma), Delta_T_arr_obs(f1,f2, gamma), F_nu_obs(f), LC_obs(t).
- Models: T_arr_mod/Delta_T_arr_mod/F_nu_mod/LC_mod; Residual: Residual = Obs − Mod.
- Consistency indices:
eta_T = | T_arr^{const} − T_arr^{gen} |,
tau_switch = | T_arr^{thick} − ( T_arr^{thin} + Delta_T_sigma ) |. - Lower bound & energy: LB = L_path / c_ref; R_env + T_trans + A_sigma = 1; sidedness n_eff^± ≥ 1.
- Guards & isolation: n_eff ≥ 1; T_fil ≠ T_trans; n ≠ n_eff; f_em = f_obs • (1+z_obs) (for K-correction).
IV. Error Stratification & Sources
- Metrology layer: u(T_arr_obs), timebase & sync; F_nu/LC sampling & calibration; u(c_ref); transforms among coords_spec/units_spec/metric_spec.
- Causation/growth layer: u(seed), trigger‐rate u(Λ_event), growth-law params u(θ_growth); prior uncertainty and model misspecification.
- Spectral layer: u(params_sed), K-correction and luminosity distance D_L; spectral resolution and band-edge truncation.
- Propagation/interface layer: u(n_eff) (from F and H_sea params), segmentation { ell_i } & endpoint tolerances, Delta_T_sigma triggers, triplet {R_env,T_trans,A_sigma} estimation error.
- Numerics: path discretization and quadrature errors; interpolation error (no cross-interface interpolation); convergence gate eps_T.
- Band/orientation: differential OOB leakage; frequency mis-registration; directional terms b1/b1_n regression uncertainty; multi-path weights w_m.
- Environment: injected and drifting TBN(x,t).
V. GUM Uncertainty Propagation (Two-Form Arrival Time)
Constant pull-out (discrete approximation)
T_arr ≈ (1/c_ref) * ∑_{k=0}^{N-1} n_eff[k] • Δell[k]
Sensitivities:
∂T_arr/∂c_ref = − T_arr / c_ref
∂T_arr/∂n_eff[k] = Δell[k] / c_ref
∂T_arr/∂Δell[k] = n_eff[k] / c_ref
Combination:
u_c^2(T_arr) ≈ (∂T/∂c_ref)^2 u^2(c_ref)
+ ∑ ( (Δell[k]/c_ref)^2 u^2(n_eff[k]) )
+ ∑ ( (n_eff[k]/c_ref)^2 u^2(Δell[k]) )
+ 2∑∑ ρ_ij (∂T/∂q_i)(∂T/∂q_j) u(q_i) u(q_j)
with q_i ∈ { c_ref, n_eff[*], Δell[*] }. Report the correlation model ρ_ij.
General form (discrete approximation)
T_arr ≈ ∑ ( n_eff[k] / c_ref[k] ) • Δell[k]
Sensitivities:
∂T_arr/∂n_eff[k] = Δell[k] / c_ref[k]
∂T_arr/∂c_ref[k] = − n_eff[k] • Δell[k] / c_ref[k]^2
∂T_arr/∂Δell[k] = n_eff[k] / c_ref[k]
Model the spatio-temporal correlation of c_ref[k] (and its correlation with n_eff[k]) explicitly in V_ξ.
VI. Spectrum↔Arrival Joint Propagation (GUM View)
Observation model:
F_nu(f_obs) = L_nu(f_em)/(4π D_L^2) • K(z_obs), f_em = f_obs • (1+z_obs)
Illustrative first-order sensitivities:
∂F_nu/∂L_nu = [K / (4π D_L^2)], ∂F_nu/∂D_L = − 2 F_nu / D_L,
∂F_nu/∂z ≈ (∂K/∂z) • L_nu / (4π D_L^2)
Build a joint block covariance over {T_arr, F_nu, LC}, carrying cross-terms from θ_growth / params_sed / n_eff / c_ref for joint fitting and GUM composition of u_c.
VII. MC Propagation (Nonlinearity, Clamping & Events)
Use when: n_eff ∈ [1,n_max] clamping, discrete Delta_T_sigma triggers, interface type switching, significant c_ref(x,t,f) variation, or strongly nonlinear multi-path weights.
Flow:
- Sample the joint { θ_growth, params_sed, c_ref, n_eff[k], Δell[k] } (preserve shared correlations).
- Per sample compute { T_arr, Delta_T_arr, F_nu, LC }.
- Report median/quantiles, tail risk, clamping rate; compare against GUM for consistency.
VIII. Two-Form–Specific Error & Consistency
- Form selection: if max_ell |δc_ref/c_ref| ≤ eta_c, use constant pull-out; else use general and record the c_ref(x,t,f) model and u(c_ref[k]) in the contract.
- Index: ensure eta_T = | T_arr^{const} − T_arr^{gen} | ≤ threshold. Exceedance back-trace order: c_ref calibration → n_eff decomposition & assembly → segmentation & endpoints → Delta_T_sigma consistency.
IX. Thin/Thick Switching Error & Safeguards
- Definition: tau_switch = | T_arr^{thick} − ( T_arr^{thin} + Delta_T_sigma ) |.
- Rule: if Delta_k/L_char ≤ eta_w, pick thin; in the gate neighborhood, dual-run and record tau_switch; if out-of-gate, lock thick chain.
- Defense: symmetric endpoint root-finding with strict tolerances; reduce step in high Xi_k(chi) regions; log trigger statistics and impact.
X. Differential & Out-of-Band Leakage
Same-path differential:
Delta_T_arr = (1/c_ref) ∫ ( n_path(f1) − n_path(f2) ) d ell (constant pull-out)
Delta_T_arr = ∫ ( ( n_path(f1) − n_path(f2) ) / c_ref ) d ell (general form)
Consistency: share the same { gamma[k], Δell[k] }, segmentation, and Delta_T_sigma settings across the two bands; fold OOB residuals into u_sys and record leakage ratio & alignment policy.
XI. Path Discretization, Quadrature & Interpolation
- Three-gate adaptivity: curvature ‖ d^2γ/dℓ^2 ‖, medium change | d n_eff / dℓ |, layer strength Xi_k(chi); explicitly include endpoints in the integral.
- Error estimates: intra-segment dual-order quadrature difference; global error as RSS; target | T_arr^{(fine)} − T_arr^{(coarse)} | ≤ eps_T.
- Interpolation: fixed order on grids; symmetric stencils near interfaces; no cross-interface interpolation—must segment.
XII. c_ref Calibration & Drift Guard
- Calibration:
c_ref = ( ∫ n_eff_ref d ell ) / T_arr_ref (constant pull-out) or solve numerically for general form; record environment block and uncertainty. - Drift: track c_ref(t); add cross-environment reuse via drift_budget into u_sys(c_ref); eta_T must still pass after cross-application.
XIII. K-Correction, Luminosity Distance & Spectral Errors
- K-correction: the correlation of K(z) with L_nu enters the joint covariance (coupling to T_arr/Delta_T_arr governed by band dependence of n_eff(f)).
- D_L model: must be declared in the contract with units; sensitivity ∂F_nu/∂D_L = − 2 F_nu / D_L; propagate cosmology uncertainty into u_sys.
XIV. Clamping, Saturation & Nonlinearity
- Clamping: enforce n_eff ∈ [1, n_max]; triggers reduce local sensitivity and bias estimates.
- MC defense: truncated/reflective sampling; report clamping rate and T_arr/Delta_T_arr bias; persistent triggers indicate modeling or data-quality issues → back-trace.
XV. Bias Detectors, Falsification Lines & Guardband
Detectors:
- Lower bound: T_arr_obs − L_path/c_ref < −k•u_c.
- Form: eta_T > threshold.
- Thin/thick: tau_switch > gate.
- Differential: Delta_T_arr nonlinearity or slope mismatch not due to OOB leakage.
- Energy: R_env + T_trans + A_sigma ≠ 1.
- Sidedness: n_eff^± < 1.
Falsification: meet any detector and rule out implementation/metrology error → register a falsification sample and enter Ch. 11 audit; three independent reproducible falsifications on the same dimension trigger P70-* and parameterization review.
Guardband: GB = k_guard • u_c; edge samples enter a review queue and receive MC re-checks.
XVI. Logging & Audit (Minimal Fields)
- Physics & geometry: hash(Catalog/Seeds/Trajectory/SeaProfile/Phi_T/n_eff/gamma), Sigma_env labels and { ell_i } tolerances.
- Modes & thresholds: mode, eps_T, eta_T, eta_c, eta_w, tau_switch, lower-bound margin T_arr − L_path/c_ref.
- Energy & differential: {R_env,T_trans,A_sigma} residuals, Delta_T_sigma trigger stats, Delta_T_arr linearity and OOB leakage ratio.
- Spectral & causation: params_sed and θ_growth hashes/priors/covariances; K and D_L stances and units.
- Uncertainty: u_stat, u_sys, u_c, GUM/MC configs, k, seed.
- Audit bundle: data, code, parameters, SolverCfg/metric_spec, hash manifest, falsification samples, replay entrypoints.
XVII. Interfaces & Implementation Binding (Aligned with Template; I70-* Safety Checks)
- check_dimension( expr ) -> DimReport — dimensional/unit checks.
- propagate_uncertainty_GUM( inputs ) -> u_c / propagate_uncertainty_MC( inputs, Nsamples, seed ) -> dist — twin propagation paths.
- check_dual_arrival_consistency( inputs ) -> eta_T — two-form gate.
- consistency_thin_vs_thick_EO( inputs ) -> tau_report — thin/thick gate.
- estimate_energy_triplet( data, Sigma_env ) -> { R_env, T_trans, A_sigma } — energy closure audit.
- log_artifacts_EO( meta, hashes, metrics ) -> Log — logging & audit hardening.
Constraints: enforce n_eff ≥ 1 and lower-bound auditing at ingress; differential reuse of identical path discretization and correction settings.
XVIII. Cross-References
- EFT.WP.Cosmo.EarlyObjects v1.0: Ch. 3 (minimal equations), Ch. 4 (causation), Ch. 5 (coupling & growth), Ch. 6 (radiation & propagation), Ch. 7 (metrology), Ch. 8 (interfaces), Ch. 9 (numerics), Ch. 11 (validation).
- EFT.WP.Cosmo.LayeredSea v1.0: interface/layer consistency and tau_switch.
- EFT.WP.Propagation.TensionPotential v1.0: two-form and differential flows.
- EFT.WP.Core.Metrology v1.0 / Errors v1.0: metrology and falsification baselines.
XIX. Deliverables
- Error-budget checklist: GUM/MC inputs, correlation assumptions, output metrics templates (including spectrum–arrival joint items).
- Safeguard playbooks: operational runbooks for forms, segmentation, energy closure, thin/thick switching, differentials, c_ref, K & D_L, directionality & multi-path, clamping/saturation.
- Audit templates: bias-detector dashboard, falsification cards, guardband configuration, tau_switch/eta_T & energy-closure reports, replay guide and hash manifest.
Copyright & License (CC BY 4.0)
Copyright: Unless otherwise noted, the copyright of “Energy Filament Theory” (text, charts, illustrations, symbols, and formulas) belongs to the author “Guanglin Tu”.
License: This work is licensed under the Creative Commons Attribution 4.0 International (CC BY 4.0). You may copy, redistribute, excerpt, adapt, and share for commercial or non‑commercial purposes with proper attribution.
Suggested attribution: Author: “Guanglin Tu”; Work: “Energy Filament Theory”; Source: energyfilament.org; License: CC BY 4.0.
First published: 2025-11-11|Current version:v5.1
License link:https://creativecommons.org/licenses/by/4.0/